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MFS-R
Reflection Measurement System
Reflection Measurement System
| Wavelength range | 380-950nm or custom |
| Thickness range (Optional) | 300-400,000 Angstrom |
| Resolution | 2nm |
| Accurancy | ±1% at 550nm |
| Receive mode | Integrating sphere |
| Light source | Halogen |
| Measuring Speed | 0.5-3 sec. |
| Stage | 10X10cm manual stage or custom |
