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MFS-R
Film Thickness Measurement System
Film Thickness Measurement System
| Wavelength range | 380-950nm or custom |
| Thickness range | 300-400,000 Angstrom |
| Resolution | 1nm-2nm |
| Accurancy | 1% (Thckness >1,000 Angstrom) |
| Receive mode | Integrating sphere |
| Light source | Halogen |
| Measuring Speed | < 1 sec |
| Stage | Fixed or custom |
| Application | Thin film solar cell Optical coatings FPD LCD and LED Semiconductor and Dielectrics |
